Automated Test Data Generation for Embedded System Models Using Combinatorial Testing

Abstract— Embedded systems have been playing very important roles in modern society. They appeared every aspect of life from automotive to avionics industries home appliances, etc. These embedded therefore must satisfy high quality requirements. As a consequence, assurance for these kinds has attracted much attention and investment both academic research industry communities. In developing systems, testing often requires coverage with different measures respect international standards like Decision Coverage (DC), Condition (CC), Modified Condition/Decision (MC/DC) respected ISO 26262. However, it is difficult generate test cases due the complexity system, larger number inputs, complex continuous signals inputs. order good DC, CC, MC/DC measures, this paper proposes method automatically test-cases by applying Combinatorial technique. The requirements inputs model will be encoded input technique that cover all pair values any two Experiments on case studies showed proposed result better than random method.